Applying Residue Arithmetic Codes to Combinational Logic to Reduce Single Event Upsets_RADECS_2013
نویسندگان
چکیده
Mitigating Single Event Upsets (SEU) in combinatorial logic is conventionally accomplished through redundancy based Radiation Hardening By Design (RHBD) methods such as Triple Module Redundancy (TMR). A hardening technique based on residue arithmetic codes (RAC) is proposed as a lower overhead alternative for detecting and correcting SEUs in arithmetic logic units. Simulations and analyses at the 45nm node show that RAC detects over 99% of faults with 2.6X less area and 157% less energy than TMR.
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